Master Thesis / Project Work: Variability Investigation of Fabricated VOFETs
Motivation, Introduction, and Content:
Process variability introduces variations on the main electrical parameters of VOFETs. Statistical variation of parameters such as threshold voltage, mobility, channel length, and channel width can clearly affect the characteristics of the studied devices. Monte Carlo (MC) simulation is going to be used to determine the statistical performance of VOFET based circuits. The extraction of physics-based variability models for VOFETs will be targetted within the project.
Tools and Prerequisites:
- EIT-Master student with knowledge in physics of semiconductors and FETs.
- Access to the Simulator.
- Access to the device analyzer and fabricated VOFETs for characterization.