Veröffentlichungen

Aufsätze / Articles

1. G. Böhne, T. Sure, R. G. Ulbrich and W. Schäfer: Phase memory of the electronic polarization in transient nonlinear optical spectra of gallium arsenide at 2 eV, Phys. Rev. 41, p. 7549-58 (1990).

2. W. Schäfer, G. Böhne, T. Sure and R. G. Ulbrich: Laser excitation and relaxation processes of electron-hole pairs in gallium arsenide at a 100 fs timescale, J. Lumin. (Netherlands), vol. 45, p 211-14 (1990).

3. T. Sure: Real-Time Confocal Scanning Microscope - an instrument with a better depth resolution, in Scanning Microscopy, Symposium Proceedings, Springer, 167-185 (1992).

4. H. Engel, Ch. Stey und T. Sure: Mikrospektralphotometrische Methoden für die Qualitätskontrolle von Liquid Crystal Displays mit Hilfe des Systems Leitz MPV-SP, Mitteilungen für Wissenschaft und Technik, Bd. X, Nr. 7 S 238-244 (1994)

5. H. Engel, Ch. Stey und T. Sure: Mikrospektralphotometrische Untersuchungen an Liquid Crystal Displays in polarisierten und unpolarisierten Licht, Jahrbuch für Optik und Feinmechanik 1995, Schiele & Schön, Berlin, S 26-50.

6. T. Sure: Optische Komponenten, in VDI Handbuch Band 11 „Materialbearbeitung mit Excimerlasern“, S. 10-16 (1998).

7. T. Sure: Anforderungen der Konfokalmikroskopie an die Qualität von Mikroobjektiven, Mitteilungen für Wissenschaft und Technik, CDR2, S 22-48 (1999)

8. T. Sure: Konfokalmikroskopie: Technologiemotor für Design und Produktion von Mikroobjektiven, Jahrbuch für Optik und Feinmechanik 2000, S. 1-39, Schiele & Schön, Berlin

9. T. Sure, J. Wesner, J. Heil: Requirements for the design and production of high numerical aperture objectives for 4Pi confocal microscopy, in "Current Development in Lens Design and Optical Engineering III" Proceedings of SPIE Vol. 4441, 43 -52, (2001)

10. J. Wesner, J. Heil, T. Sure: Reconstructing the pupil function of microscope objectives from the intensity PSF, in "Current Development in Lens Design and Optical Engineering III" Proceedings of SPIE Vol. 4767, p. 32-43, (2002)

11. T. Sure: Konfokales Mikroskop, Patentschrift, DE P 101 33017, EP P 02 100 769, US P 10/189 245 JP P 2002-197335 erteilt 03.07.2003

12. T. Sure, J. Heil, J. Wesner: Microscope objective production: on the way from the micrometer scale to the nanometer scale, in "Optical Manufacturing and Testing V", Proceedings of SPIE Vol. 5180, 283-292, (2003)

13. J. Heil, J. Wesner, W. Müller and T. Sure: Artificial star test by real-time video holography for the adjustment of high-numerical-aperture micro-objectives}, APPLIED OPTICS, Vol. 42, No 25, 5073-5085, (2003)

14. J. Heil, T. Bauer, W. Müller, T. Sure, J. Wesner: New tools for high-precision positioning of optical elements in high-NA microscope objectives, in "Optical Fabrication, Testing and Metrology", Proceedings of SPIE Vol. 5252, p. 431-442, (2003)

15. J. Wesner, F. Eisenkrämer, J. Heil and T. Sure: Improved Polarization Ray Tracing of Thin-film optical Coatings "Novel Optical Systems Design and Optimization", Proceedings of SPIE Vol. Vol. 5524, p.261-272, (2004)

16. C. Gunkel und T. Sure: Mikroskopobjektiv-Fertigung: Auf dem Weg von der Mikrometerskala zur Nanometerskala, Jahrbuch für Optik und Feinmechanik 2005, Schiele & Schön, Berlin

17. T. Sure, V. Guyenot and M. Gerhardt: Automatically High Precision Manufacturing Technology for Micro-Optic Subgroups, Technical Digest of SPIE, Vol. TD03, p. 12-14, (2005)

18. T. Sure, Tobias Bauer, Joachim Heil, Joachim Wesner: DUV-Microscope objectives: technology driver that forces the production to switch from the micrometer scale to the nanometer scale.( Invited Paper) "Optical Fabrication, Testing and Metrology II", Proceedings of SPIE Vol. 5965, (2005)

19. T. Sure, L. Danner, P. Euteneuer, G. Hoppen, A. Pausch, W. Vollrath: Ultra High Performance Microscope Objectives - The State of the Art in Design, Manufacturing and Testing. (Invited Paper) "International Optical Design Conference 2006", Proceedings of SPIE Vol. 6342 (2006)

20. J. Heil, T. Bauer, T. Sure, J. Wesner: Iterative full-bandwidth wavefront reconstruction from a set of low-tilt Fizeau interferograms for high-numerical-aperture surface characterization, APPLIED OPTICS, Vol. 45, No 18, 4270-4283, (2006)

21. R. Berger, T. Sure, W. Osten: Measurement errors of mirrorlike, tilted objects in white-light interferometry, Proc. SPIE, Vol. 6616, 2007

22. C. Gunkel, T. Sure: Assembly of spherical Lenses (HQ Optics) in "Advanced Optics Using Aspherical Elements", SPIE Vol. No. PM173, p 364-370 (2008), Editors: B. Braunecker, R. Hentschel, and H. J. Tiziani